Mutation Testing Author

Name: Wei Chen
Affiliation: Microsoft
Email: wei.chen@microsoft.com
Webpage:
1Wei Chen and Roland H. Untch and Gregg Rothermel and Sebastian Elbaum and Jeffery von Ronne
Can Fault-Exposure-Potential Estimates Improve the Fault Detection Abilities of Test Suites?
Software Testing, Verification and Reliability, 12(4), December 2002.
BibTeX | Abstract | URL